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APA: Vinay Kukreja; Deepak Kumar; Ankit Bansal; Vikas Solanki. (Volume-, Issue- -(Year-2022)). Recognizing Wheat Aphid Disease Using a Novel Parallel Real-Time Technique Based on Mask Scoring RCNN. Retrieved from https://ieeexplore.ieee.org/document/9823459 Copy
Chicago: Vinay Kukreja; Deepak Kumar; Ankit Bansal; Vikas Solanki. "Recognizing Wheat Aphid Disease Using a Novel Parallel Real-Time Technique Based on Mask Scoring RCNN" Example, Volume--issue--Year-2022-978-1-6654-3789-9. https://ieeexplore.ieee.org/document/9823459. Copy
