Review On Smart Digital IC Testing System Using Microcontroller

Atharv Santosh Shinde; Mahesh Mahadev Patil; Omkar Shashikant Salunkhe; Ajay Sampat Khade; Onkar Mohan Maske; Ganesh Yashwant Nangare; Mrs. Sima Shinde

Review On Smart Digital IC Testing System Using Microcontroller

Author : Atharv Santosh Shinde, Mahesh Mahadev Patil, Omkar Shashikant Salunkhe, Ajay Sampat Khade, Onkar Mohan Maske, Ganesh Yashwant Nangare, Mrs. Sima Shinde Journa Name: International Journal of Science, Engineering and Technology Volume: 14 issue: 2 Year: Volume-14-issue-2 Views : 189

Abstract:

Integrated Circuits (ICs) are the foundation of modern electronics; however, manual functional verification is often labour-intensive and prone to errors. This paper introduces a Smart Digital IC Testing System that utilizes an Arduino Mega 2560 microcontroller to automate the testing of 74-series logic gates (AND, OR, NOT, NAND, NOR, XOR), a 555 timer, and a 741 op-amp through a ZIF socket, a 4x4 keypad, and an LCD/buzzer for feedback. The system applies predefined input patterns and compares the outputs against embedded reference values, providing pass/fail results. It incorporates protective features such as current-limiting resistors and voltage clamping. Priced at ?6040, this system offers high accuracy, portability, and upgradability, making it ideal for laboratories and repair shops. It effectively addresses the shortcomings of previous Arduino/ by integrating mixed-signal verification within an affordable platform.