×

Facial Recognition Attendance Monitoring System

Author : Sanyam Mittal, Vanshika Garg, Aaditya Jain, Shubhi Verma Journa Name: International Journal of Science, Engineering and Technology Volume: 14 issue: 2 Year: Volume-14-issue-2 Views : 200
Abstract:
Traditional attendance systems employed in educational institutions and workplaces suffer from inherent inefficiencies, including susceptibility to proxy attendance, high administrative overhead, and slow data processing. This paper presents the design and implementation of an automated Facial Recognition Attendance Monitoring System (FRAMS) developed using Java and the OpenCV computer vision library. The proposed system leverages the Haar Cascade Classifier for robust real-time face detection and the Local Binary Pattern Histogram (LBPH) algorithm for accurate face recognition. The architecture integrates a webcam-based image acquisition module, a preprocessing pipeline for noise reduction and face normalization, an LBPH-trained recognition engine, and a MySQL database for persistent attendance storage. Experimental results demonstrate a recognition accuracy of up to 97.4% under optimal lighting conditions, with an average frame processing time of 210 milliseconds. The system effectively eliminates proxy attendance, reduces administrative workload, and enables real-time monitoring without requiring specialized hardware. Evaluation across diverse environmental conditions confirms the system’s robustness, with performance metrics substantially outperforming conventional attendance modalities. This work contributes a practical, cost-effective, and scalable solution to institutional attendance management.

Related Indexing Platform

Indexed

Zenodo Logo
Zenodo
Research Data Repository
https://zenodo.org/records/19347159
DOI
DOI Resolver
Global Persistent Identifier
https://doi.org/10.5281/zenodo.19347159
GS
Google Scholar
Search this title on Scholar
Search on Google Scholar
SS
Semantic Scholar
Search this title
Search on Semantic Scholar
Lens
Lens.org
Check citations via DOI
Search on Lens.org
Leave Your Comment

Related Reviewers